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Feature
Substrate Size
Resolution
Alignment Accuracy
Wave Length
UV Intensity
UV Beam Uniformity
Contact Mode
Microscope
Manual, PLC, Touch
piece, 4", 6"
1? in vacuum contact with Thin PR@Si Wafer
1 ?
365~436nm /I,H,G line
≤max25mW/cm²
±3%~±5%
Vacuum/Hard/Soft
Dual CCD Zoom Microscope
Semi Auto
6”, 8”, 12
≤max20mW/cm²
±3%~±5%
Vacuum/Hard/Soft/Poximity
Dual CCD Zoom Microscope